CMSE-SEF IAP presentations - 2008

Introduction to the Shared Experimental Facilities - January 10th.

A. J. Garratt-Reed - Introduction

T. McClure - Optical and Thermal systems

Y. Zhang - Transmission Electron Microscopy

P. Boisvert - Scanning Electron Microscopy, Microtome

E. Shaw - Surface and Thin Film analysis

S. A. Speakman - X-ray Diffraction

S. Chu - Crystal Growth, SQUIDs, ICP-AES

Energy-Dispersive X-ray Analysis in the TEM - A - Theory

A. J. Garratt-Reed - Click HERE