JEOL JSM-5910 Scanning Electron Microscope

The Jeol 5910 is a general purpose SEM, with the following attributes:

Very easy to use

Remotely accessible via the Net

Rontec EDX system for elemental analysis and mapping

Can view the entire surface of a 20cm wafer

SPECIAL FEATURE 

JEOL BEI DETECTOR

Electron Microscopy Home Page

MIT-CMSE Electron Microscopy/tonygr@MIT.EDU
Document last reviewed September 27th. 2007