JEOL 6320FV 

SEM IMAGES
 
 

	Back-Scattered Electron Images When an electron beam hits a sample, back-scattered electrons, among other signals, are emitted.The quantity of back-scattered electrons is highly dependent on the atomic number of the sample. Material with a larger atomic number will give off more backscattered electrons. This is a backscattered electron image of lead-tin solder. Lead has a much higher atomic number than tin and therefore gives off many more electrons. The lead signal is much more intense, and in this picture the lead particles appear brighter than the surrounding tin.
	6 way test fix up for testing 6 directions of force,  predesign for an accelerometer used in auto air bags
	First omniguide fiber

Polymer spheres being prepared for drug delivery

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of less than 1.25 nm when operating at 15KV, and about 2.5nm when operating at 1KV. It is fully digital.

In its high-resolution mode it is used, of course, for imaging extremely fine structures, while in the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.

It is also equipped with a back-scatter electron detector and an energy-dispersive x-ray detector.
 

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MIT-CMSE Electron Microscopy/tonygr@MIT.EDU
Document last reviewed September 27th. 2007.