Welcome to the homepage for the X-Ray Diffraction SEF

News in the X-ray Lab- click on the link to read the item
Current Equipment and Lab Status
Training and Workshops for June and July

Holiday Hours in the X-Ray Lab

July 3 is an MIT holiday; I am also taking July 6 as a vacation day. Therefore, on July 3-6 the X-ray lab will be closed. Only users with after-hours access will be able to use the equipment. Remember that you should never work in any lab alone.

Current Lab Status

The Rigaku X-Ray Diffractometer is broken. Instead of repairing the old generator yet again, I am moving the right-hand side (185mm) goniometer to a new(er) generator. I hope to have this transition done by July 13. Experienced users will need to attend a short training session to learn how to use the new generator. I know that the extended downtime is inconvenient, but hopefully when this is done the Rigaku should be a lot more reliable.

The PANalytical X'Pert Pro is broken and will not be repaired until 11 am on Tuesday, July 7, at the earliest.

The Bruker HRXRD is repaired and seems to be working well.

The Bruker D8 with GADDS splits its time between two configurations, HRXRD and Area Detector, which are installed in a week-on/week-off schedule. I can change the configuration for you if the situation is desperate, but otherwise you should plan your use of this instrument around this schedule:

June 29- July 6: High Resolution (RSM, RC, XRR)
July 7- July 13: Area Detector (pole figures, microdiffraction, etc)

The two computers running the Rigaku have been replaced. You can find your old data files in the folder "c:\temp\recovered from old computers". Old files from the left and right-hand side computers are on both of the new computers, in folders labeled 'temp from old LHS' and 'temp for old RHS'.
Please remember that we do not back up data in the X-ray lab. You should always back up your data after it is collected.

The furnace for the PANalytical is broken. I have to send the temperature controller back to the manufacturer-- it will take a couple of weeks before it is repaired.

Training Classes for June and July

Here is the schedule for upcoming training classes using equipment in the X-ray Diffraction SEF. Please go to the training webpage for more complete descriptions of the classes. Prior to attending a class, you must RSVP and send me the completed Training Request form.

EHS X-Ray Safety: Analytical/Industrial- this class is mandatory for all people using the X-ray SEF. You can sign up for the course through MIT SAPweb self-service.
June 18, 1:30 to 2:30 pm
July 16, 10:30 to 11:30 am

June 22, 1 to 3:30 pm: Basics of XRD Lecture
June 22, 3:30 to 4:30 pm: Mandatory Lab-Specific Safety Training
both will be offered again July 13 at the same times

June 23, 1 to 4 pm: Data Collection using the Rigaku Diffractometer POSTPONED: because the Rigaku generator is broken, this training has been postponed. It will be rescheduled when the instrument is repaired.
offered again on July 15

June 24, 1 to 4 pm: Data Collection using the PANalytical X'Pert Pro diffractometer (high-speed configuration)
offered again on July 21

June 25, 1 to 5 pm: Data Collection using the 2D Area Detector on the Bruker D8 with GADDS

Basic XRPD Data Analysis using Jade: this workshop is offered several times each month

• June 26, 1 to 4 pm
• July 1, 1 to 4 pm
• July 17, 1 to 4 pm
• July 23, 1 to 4 pm

July 9, 1 to 5 pm: Epitaxial Thin Film Analysis using HRXRD (limited enrollment)

July 10 1 to 4 pm; Nanocrystallite Size Analysis using X-Ray Diffraction

If you need data before the next training session, please contact me and we will make arrangements.

Other classes or repeat sessions of these classes can be offered if you email me and let me know your interest.

New High-Resolution X-Ray Diffractometer

The new HRXRD instrument is installed and available for use. This instrument is a very high resolution diffractometer designed for the study of multilayer epitaxial thin films. This instrument has a Ge(440) 4-bounce symmetric incident-beam monochromator with a divergence between 5 and 7 arcseconds. It also features automated swiching between the double-axis mode and the triple-axis mode using a Ge(220) 3-bounce analyzer crystal.

The Bruker D8 is also being upgraded. The new Vantec2000 2-dimensional detector has already been installed. This detector features better dynamic range, resolution, and radiation hardness compared to our old Hi-Star GADDS detector-- making this instrument much better for studying films on single crystal substrates. We will also be receiving a new 1-dimensional position sensitive detector for better resolution data collection, and an Ge(220) 4-bounce asymmetric incident-beam monochromator. This will allow this instrument to collect 2-dimensional images and microdiffraction data from a wide variety of samples; or to be used in the study of simpler epitaxial thin films.

IAP Materials

Powerpoints slides from lectures presented during the 2008 IAP have been posted on this website- click here.

Our Collaboration with the MIT Dept. of Chemistry

The CMSE single crystal diffractometer is located in Dr. Peter Müller's lab in Bldg 2-325. This collaboration between the CMSE and the Dept. of Chemistry will provide better support for our users interested in single crystal diffraction. CMSE users will pay Peter Müller and the Dept. of Chemistry for use of the instrument; however, they will enjoy the same discounted rate as members of the Dept. of Chemistry and will be able to leverage the expertise of Dr. Müller.

The X-Ray Lab is Open from 9 am to 5 pm on normal business days.