The Rigaku Smartlab is fully functional. If you would like to be trained in its use, please contact facility staff.
The Rigaku SmartLab is our "Swiss Army Knife" of tools. It is capable of performing most common XRD measurements as well as many uncommon ones, and can be rapidly switched between various optical configurations including both Bragg-Brentano and Parallel-Beam geometries. It gives very good X-ray reflectivity (XRR) and grazing incidence XRD (GIXD) results. It also features a 9kW rotating anode X-ray source, which produces a much higher intensity beam than sealed tube anodes. Because of its flexibility, most users can collect useful data on this instrument, but we especially recommend it for users who will be studying polycrystalline or epitaxial oxide thin films.
The default configuration of this instrument uses the scintillation point detector, which is good for nearly all types of measurements. With the basic training, users can easily switch between parallel-beam and Bragg-Brentano divergent beam optics via the Rigaku Cross-Beam Optics (CBO) system. Because of the high intensity of the X-ray source, XRR data can be collected from very thin films, down to ~0.9nm thickness (depending on roughness, density, and other factors).
With additional one-on-one training, users can select between the many accessories available for the SmartLab:
- A D/teX Ultra linear position sensitive detector, which significantly increases data collection speed from polycrystalline samples in Bragg-Brentano or converging beam modes
- An incident-beam Ge(022) monochromator, which is used for high resolution diffraction from epitaxial films on single crystal substrates and for XRR on relatively thick films up to ~300nm
- A diffracted beam monochromator, used to eliminate Cu Kbeta and tungsten contamination peaks and to reduce background intensity. This is primarily useful for iron and cobalt containing materials, which fluoresce from Cu radiation, and can help with estimating percent crystallinity from partially amorphous materials.
- A capillary stage, used to hold and spin capillaries of various diameters for data collection in transmission mode. This can be useful for polycrystalline materials that show strong preferred orientation due to particle shape effects. This stage can be used with converging beam optics to significantly increase X-ray flux through the sample. It can also be used with the D/teX Ultra linear detector for very rapid scans.
- A furnace, capable of heating to 1400°C in air, inert gases, or vacuum, for in-situ XRD measurements
- A battery cell designed to charge and discharge Li-ion based battery materials in-situ. Users are responsible for providing the electrical equipment necessary to charge and discharge their batteries.
- An in-plane arm, which allows the point detector to traverse more than a quarter hemisphere around the sample. With sample rotation, this allows the system to collect reciprocal space maps (RSMs), in-plane pole figures, and in-plane grazing incidence XRD scans.