Upcoming Training Sessions and Classes
To become a self-user in the X-Ray Diffraction SEF, you must complete:
- complete the EHS class #EHS0361c-A, X-Ray Safety: Analytical/Industrial
- complete the EHS online class #EHS0100w-A, General Chemical Hygiene
- complete the lab-specific safety training taught by Scott Speakman
- complete the instrument specific training taught by Scott Speakman
- it is highly recommended that you also attend the "Basics of XRD" lecture and the "Basic XRPD Data Analysis using Jade" or the "HRXRD Data Analysis using LEPTOS" workshop taught by Scott Speakman
- Please complete the Training Request Form in MS Word and e-mail it to me (speakman@mit.edu) along with a list of the classes that you would like to attend
A note about the cost of training: the first time you get trained to operate an instrument in the X-ray lab, I will charge your research account $200 (academic rate). Once you have paid this amount, you can attend any additional training sessions, for operating other instruments or data analysis, for free.
If you need to collect data before the next training session, please contact me and I will gladly help you.
Chronological List of Upcoming Training Classes (Nov)
Click on the link or scroll down to the bottom of this page to read a complete description of each class.
Remember, prior to the class you should download and complete the training request form and e-mail it to me (speakman@mit.edu) along with a list of the classes that you would like to attend.
Nov 3 , 1 to 4 pm: Basics of XRD Lecture
Nov 3 , 4 to 5 pm: Mandatory Lab-Specific Safety Training
Nov 5 , 1 to 4 pm: Data Collection using the Rigaku Diffractometer
Nov 10 , 1 to 4 pm: Data Collection using the PANalytical X'Pert Pro diffractometer (high-speed configuration)
Nov 12 , 10:30 to 11:30 am: EHS course on X-Ray Safety: Analytical/Industrial
Nov 12, 1 to 4 pm: Basic XRPD Data Analysis using Jade
Nov 17, 1:30 to 5 pm: Data Collection using the 2D Detector on the Bruker D8 with GADDS for texture (pole figure) and microdiffraction analysis
Nov 18, 1 to 4 pm: Basic XRPD Data Analysis using Jade
To following courses are not yet scheduled: contact speakman@mit.edu if you are interested in taking this course and I will add it to the schedule
I can also offer classes on topics such as: quantitative phase analysis, percent crystallinity analysis, lattice parameter refinement, residual stress analysis, pole figure texture analysis, etc. Just let me know if you are interested.
A note about the cost of training: the first time you get trained to operate an instrument in the X-ray lab, I will charge your research account $200. Once you have paid this amount, you can attend any additional training sessions, for operating other instruments or data analysis, for free.
Slides from past lectures are available here.
Training for New Users
This is the training course for people interested in becoming independent users of the X-ray SEF.
Training costs $200 for academic users and $700 for commercial (non-academic) users. This is a one-time fee; you can attend any number of training sessions for different instruments or analysis techniques without being charged this fee again.
There are several components to this training that you must complete:
- complete the EHS class #EHS0361c-A, X-Ray Safety: Analytical/Industrial
- complete the EHS online class #EHS0100w-A, General Chemical Hygiene
- complete the lab-specific safety training taught by Scott Speakman
- complete the instrument specific training taught by Scott Speakman
- background lecture on practical X-ray diffraction, "Basics of XRD" (only for XRPD analysis; not for HRXRD analysis)
To register for training, please download this MS Word form, complete it, and e-mail it to me at speakman@mit.edu. Also tell me all training classes that you would like to attend. You should RSVP at least 3 business days before the class.
I have split the training classes into several smaller sessions. Hopefully, this will allow you to attend only those sessions that are relevant to your research. If you have any questions about which sessions you should attend, please contact me.
I realize that this training is a large time committment on your part. I have worked to streamline the training as much as I can. This time represents the complexity in educating you about safety hazards that you may not have worked with before, teaching you how to use the instrument safely and effectively, and making sure that you have the minimal background necessary to extract useful and accurate information from the diffraction data. If this schedule does not fits your needs, please contact me and I will do my best to accommodate you. Please be aware that if we must, and are able, to schedule a one-on-one training session because of the limitations of your availability, you will be charged at the hourly assisted-use rate of $120/hr instead of the $200 flat fee.
Some classes will be held multiple times. You only need to attend one session. Please e-mail me and let me know what sessions you would like to attend.
Mandatory EHS course on X-Ray Safety
Nov 12 from 10:30 to 11:30 am in N52-496A
Dec 11 from 2 to 3 pm in N52-496A
This mandatory safety class is taught by EHS. You must register for this class through EHS, not through me. MIT personnel can register for this course at MIT SAPweb Self Service. You will be required to provide me with proof that you have completed this training. E-mail me if you need to pursue alternative arrangements because you cannot attend either of these classes.
Mandatory Laboratory Specific Safety Training:
Nov 3 from 4 to 5 pm in 13-4041
You must attend one of the sessions offered. This class covers the dangers and safety devices that are specific to the X-ray lab. Whereas the EHS X-Ray Safety class is designed to make you aware of the dangers of X-radiation, this class is designed to show you the safety devices and protocols that are in place to protect you.
Lecture on the Practical Basics of X-ray Diffraction (optional, but strongly recommended)
Nov 3 , 1-4 pm in 13-4041
This lecture will survey the fundamentals of X-ray diffraction, with a focus on practical considerations such was what information is contained in an X-ray diffraction pattern, considerations for collecting the best quality diffraction patterns, common sources of error, etc. Users who have previous experience with XRD, such as work at another institution, may request an exemption from this class. In general, I find that undergraduate courses such as 3.271 and 3.60 do not cover much of the practical information contained in this lecture, so even if you have taken those classes you should still attend this lecture. You can preview the Powerpoint slides for this class.
Rigaku RU300 Instrument Specific Training
Nov 5, 1 to 4 pm in 13-4027
This class will teach you how to specifically operate the Rigaku RU300 Powder X-Ray diffractometer. This is the most commonly used instrument in the X-ray lab. If you think that you will not be using this instrument, but need to use a different instrument instead, then please e-mail me so that we can discuss alternative arrangements. Please be aware that if a large number of people register for training, we may need to create a second session.
PANalytical X'Pert Pro Instrument Specific Training
The PANalytical X'Pert Pro can be used in several different configurations. The initial training covers use of the high-speed divergent-beam optics. Users may then opt to attend training for using additional configurations of the PANalytical X'Pert Pro, including using the parallel-beam optics, using the in-situ sample stages, etc.
Data Collection using the High-Speed Optics on the PANalytical X'Pert Pro
Nov 10 , 1 to 4 pm in 13-4027
This session will cover the collection of powder diffraction data using the programmable divergence slits and X'Celerator high-speed detector. This configuration is best suited for high-speed high-resolution data collection from powders and polycrystalline thin films. This configuration is also the most commonly used for in-situ experiments using the furnace that can heat samples up to 1200 C or the cyrostat that can cool samples down to 11 K.
Data Collection using the Parallel-Beam Optics on the PANalytical X'Pert Pro
not currently scheduled
This session will cover the collection of diffraction data using the Gobel mirror and parallel-plate collimator for pseudo-parallel beam data collection. This configuration is best suited for rocking curves, glancing incident angle diffraction, reflectivity, and residual stress measurements.
HRXRD and XRR Data Collection
not currently schedule
This class will teach users how to operate the Bruker High Resolution X-Ray Diffractometers. This class will cover the use of the Bruker D8 GADDS and Bruker D8 HRXRD instruments to collect:
rocking curves and reciprocal space maps using the
medium-resolution Ge(220) 4x incident beam monochromator and LynxEye detector
reflectivity curves using the LynxEye detector
rocking curves and reciprocal space maps using the ultra high-resolution Ge(440) 4x incident-beam monochromator for the analysis of epitaxial thin films.
This session will not cover the analysis or theory behind HRXRD techniques, but rather will focus solely on data collection. Use of the Bruker D8 HRXRD will be covered at the end of the class, so that users already familiar with its operation will be able to leave early.
Texture (Pole Figure) and other Analyses using 2D detectron on the Bruker D8 with GADDS
Nov 17 from 1:30 to 5 pm in 13-4027
This class will teach users about the basics of pole figure measurements for texture analysis, how to plan a pole figure measurement using the program Multex Area 2, and how to collect the data necessary for pole figure analysis.
Users are expected to complete the web-based chemical hygeine training on their own.
XRD Data Analysis
Introduction to XRPD Data Analysis using Jade
Nov 12, 1 to 4 pm in 13-4041
Nov 18, 1 to 4 pm in 13-4041
This class covers the use of the Jade software to analyze XRD data. Emphasis in this class is on mastering the user interface, comparing experimental data to reference patterns, and phase analysis. More advanced analyses such as peak location, unit cell lattice parameter refinement, and crystallite size estimation will be demonstrated.
Advanced Analysis Techniques Using Jade
Nanocrystallite Size Analysis:
not currently scheduled
X-ray diffraction can be used to estimate the crystallite size, microstrain, and defect density of nanophase materials. The method is powerful, but prone to error when certain assumptions and limitations are not acknowledged. This class will review the common techniques used for nanocrystallite size and microstrain analysis, such as the Scherrer, Hall-Williamson, and Rietveld methods. The class will demonstrate how these techniques can be easily and correctly used in the X-ray SEF of the CMSE. Attendees will practice using empirical profile fitting in the Jade software to determine crystallite size. It will be assumed that all attendees in this session are already familiar with the basics of using Jade- you must have attended the Introduction to XRPD Data Analysis using Jade class. This session is limited in size, so you should RSVP early if you are interested. You must register by e-mailing me at speakman@mit.edu.
HRXRD and XRR Data Analysis using LEPTOS
schedule pending
The Introduction to LEPTOS class will demonstrate the functionality, user interface, and applications of LEPTOS for analyzing high-resolution rocking curves, reciprocal space maps, and reflectivity data. The class will not be comprehensive, but rather will attempt to provide attendees with enough information for additional self-discovery using the software.
Rietveld Refinement of Diffraction Data
Not currently scheduled
Learn how to refine crystal structures using the Rietveld method. Rietveld can be used to solve unknown crystal structures, determing the lattice parameters, atomic positions, site occupancies, and quantitative phase analysis. Classes usually focus on determining lattice parameters, crystallite size, and microstrain of nanocrystalline materials; however, the focus can be changed to suit the needs of your research. A small amount of time will be spend covering quantitative phase analysis. More advanced techniques, such as determining atomic positions, site occupancies, and solving unkown crystal structures will only be covered if requested by the class.
This class can be taught in a number of ways. I have taught it as a single 4 hour class, as two separate 4 hour sessions, and as a full 4 day course. Obviously, more time allows me to teach the class with in more detail and with more examples. If you are interested in this class, let me know what applications you are most interested in and how much time you are willing/able to set aside for the class. I will try to tailor the class to your needs.
If you have a laptop, bring it with you and we will install the software on your computer.
Advanced Classes in XRD Analysis
I can also offer classes in topics on advanced XRD analysis, including, but not limited too:
- Rietveld Refinement of Diffraction Data
- Crystallite Size Analysis using XRD
- Thin Film Analysis with XRD
- Quantitative Phase Analysis
- Texture Mapping with Pole Figures
If you are interested in one of these or other topics, please e-contact me and let me know what topics you are interested in. Once I know there is demand for a class, I will schedule it.
IAP 2008 Classes
The Wonders of X-ray Diffraction
X-ray diffraction is a versatile technique for measuring a number of characteristics of crystalline and semi-crystalline materials. This seminar will survey the information that might be learned from polycrystalline materials using XRD. Rather than discussing theory, examples will be used to illustrate the use of XRD to measure: quantitative phase composition, crystallite size, microstrain, residual stress, texture, rate constants and activation energies for reactions, crystallinity, etc. The capabilities and limitations of the instruments in the CMSE X-Ray SEF will also be discussed. This lecture is designed to help those unfamiliar with X-ray diffraction decide if XRD could be useful for their research. Researchers using XRD for basic phase ID may also find benefit in exploring the more advanced analyses that are possible.
Thin Film Analysis using X-Rays
X-rays can be used in many ways to analyze thin films. In February, a new high-resolution X-ray diffractometer will arrive in the X-ray SEF that will greatly enhance our ability to analyze thin films. This lecture will survey several techniques, including grazing-incidence X-ray diffraction, rocking curves, reciprocal space maps, and X-ray reflectivity. We will discuss how the X-ray SEF can help you determine the phase composition, depth profile, density, roughness, thickness, compositional gradient, stress and relaxation, defect density, and texture/epitaxy of your thin film material.
Attendees will not learn the intricacies required to apply these techniques, but rather will leave the lecture with an understanding of the potential power and limitations that XRD might offer their thin film research.
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